A novel two-dimensional Fast Fourier Transformation (FFT) based phase measurement technique for fringe pattern analysis is presented in this paper. The technique uses two fringe patterns whose phase are slightly shifted to eliminate any phase ambiguity which exists in a fringe pattern whose phase is not monotonically increasing. It is capable of extracting an accurate phase distribution from a noisy fringe pattern without assigning fringe orders and interpreting data in the regions between fringes. The technique is free from error caused by the high frequency components, the variation of background intensity, and the modulation of amplitude on fringe patterns. This technique is particularly useful for processing the high-frequency noise corrupted sinusoidal fringe patterns.

Date Published: 1 January 1991
PDF: 7 pages
Proc. SPIE 1332, Optical Testing and Metrology III: Recent Advances in Industrial Optical Inspection, (1 January 1991); doi: 10.1117/12.51123

Published in SPIE Proceedings Vol. 1332:
Optical Testing and Metrology III: Recent Advances in Industrial Optical Inspection
Chander Prakash Grover, Editor(s)