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Proceedings Paper

Design criteria of an integrated optics microdisplacement sensor
Author(s): Antonio d'Alessandro; Marco De Sario; Antonella D'Orazio; Vincenzo Petruzzelli
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Paper Abstract

Interferometer sensors using optical waveguides have been shown to be suitable for sensing a vanety of physical items such as temperature, strain, humidity, electric and magnetic fields, posItion. In this paper we study an integrated optical microdisplacement sensor making use of a Michelson interferometric configuration. The two-beam semi-asymmetric X junction is composed of four single-mode Ti diffused LiNbO3 channel waveguides at ? = 633 nm. The design criteria stress the fact that the waveguide runs at a given angle with respect to the principal reference system. The electromagnetic field evolution is obtained both by mode-matching and beam propagation methods.

Paper Details

Date Published: 1 January 1991
PDF: 9 pages
Proc. SPIE 1332, Optical Testing and Metrology III: Recent Advances in Industrial Optical Inspection, (1 January 1991); doi: 10.1117/12.51105
Show Author Affiliations
Antonio d'Alessandro, Univ. di Bari (United States)
Marco De Sario, Univ. di Bari (Italy)
Antonella D'Orazio, Univ. di Bari (Italy)
Vincenzo Petruzzelli, Univ. di Bari (Italy)

Published in SPIE Proceedings Vol. 1332:
Optical Testing and Metrology III: Recent Advances in Industrial Optical Inspection
Chander Prakash Grover, Editor(s)

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