Proceedings Paper
Interferometric fiber optic sensors for use with composite materials| Format | Member Price | Non-Member Price |
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Paper Abstract
The sensitivities of interferometer-based fiber optic sensors to both strain and temperature are compared. The first compact fiber optic strain rosette has been developed and its performance is compared with a conventional foil strain rosette when embedded within composite material. It is shown that an embedded Michelson fiber optic sensor can detect acoustic emission resulting from threshold delaminations within composite materials.
Paper Details
Date Published: 1 January 1991
PDF: 10 pages
Proc. SPIE 1332, Optical Testing and Metrology III: Recent Advances in Industrial Optical Inspection, (1 January 1991); doi: 10.1117/12.51091
Published in SPIE Proceedings Vol. 1332:
Optical Testing and Metrology III: Recent Advances in Industrial Optical Inspection
Chander Prakash Grover, Editor(s)
PDF: 10 pages
Proc. SPIE 1332, Optical Testing and Metrology III: Recent Advances in Industrial Optical Inspection, (1 January 1991); doi: 10.1117/12.51091
Show Author Affiliations
Raymond M. Measures, Univ. of Toronto and Ontario Laser and Lightwave Research Ct (Canada)
Tomas Valis, Univ. of Toronto and Ontario Laser and Lightwave Research Ct (Canada)
Kexing Liu, Univ. of Toronto and Ontario Laser and Lightwave Research Ct (Canada)
Tomas Valis, Univ. of Toronto and Ontario Laser and Lightwave Research Ct (Canada)
Kexing Liu, Univ. of Toronto and Ontario Laser and Lightwave Research Ct (Canada)
W. Dayle Hogg, Univ. of Toronto and Ontario Laser and Lightwave Research Ct (Canada)
Suzanne M. Ferguson, Univ. of Toronto and Ontario Laser and Lightwave Research Ct (Canada)
Edward Tapanes, Univ. of Toronto and Ontario Laser and Lightwave Research Ct (Australia)
Suzanne M. Ferguson, Univ. of Toronto and Ontario Laser and Lightwave Research Ct (Canada)
Edward Tapanes, Univ. of Toronto and Ontario Laser and Lightwave Research Ct (Australia)
Published in SPIE Proceedings Vol. 1332:
Optical Testing and Metrology III: Recent Advances in Industrial Optical Inspection
Chander Prakash Grover, Editor(s)
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