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Proceedings Paper

Visual inspection system using multidirectional 3-D imager
Author(s): Tetsuo Koezuka; Yoshikazu Kakinoki; Shinji Hashinami; Masato Nakashima
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Paper Abstract

This paper describes a visual inspection system for factory automation. The system is based on a multi-directional 3-D imager. Three dimensional object recognition has become increasingly important in factory automation. For example, automatic assembly of printed circuit (PC) boards can use a 3-D visual inspection system to detect incorrectly assembled devices. To be effective, measurement should be done from more than one angle. A visual inspection system has been developed based on a multi-directional 3-D imager and laser cross scanning. It can obtain range and intensity information of objects simultaneously. Range measurement is based on laser triangulation using a position sensitive detector. The system features: (1) Multi-directional 3-D measurement. The quad 3-D imager and X-Y laser scanner enable multi-directional 3-D measuremenL (2) High-speed. Measurement speed is 1 million pixels per second. Each pixel contains data for 256-height-level range and 256-gray-level intensity. One quad flat package with 160 leads can be measured in 4 seconds. (3) High-resolution. The inspection resolution is 25 jim in the X and Y directions and 30 pm in the Z direction. The visual inspection system uses the 32-bit MC68030 and 12 megabytes of image memory. The system was capable of detecting missing, shifting, and floating leads, and solderjoint defects.

Paper Details

Date Published: 1 January 1991
PDF: 9 pages
Proc. SPIE 1332, Optical Testing and Metrology III: Recent Advances in Industrial Optical Inspection, (1 January 1991); doi: 10.1117/12.51082
Show Author Affiliations
Tetsuo Koezuka, Fujitsu Labs. Ltd., Atsugi (Japan)
Yoshikazu Kakinoki, Fujitsu Labs. Ltd., Atsugi (Japan)
Shinji Hashinami, Fujitsu Labs. Ltd., Atsugi (Japan)
Masato Nakashima, Fujitsu Labs. Ltd., Atsugi (Japan)

Published in SPIE Proceedings Vol. 1332:
Optical Testing and Metrology III: Recent Advances in Industrial Optical Inspection
Chander Prakash Grover, Editor(s)

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