
Proceedings Paper
Automatic inspection technique for optical surface flawsFormat | Member Price | Non-Member Price |
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Paper Abstract
Industrial inspection of optical component surface flaws requires objective, high efficient
and fast measurement methods and instruments. In this paper, a novel method, which is
practical for on- line inspecting optical component surface flaws in manufacturing
industry, is discribed. Laser beam goes through a lean- placed mirror with a slot
in center onto the surface of the specimen. The imformation of surface flaws is
obtained through analysing the frequency spectrum of reflective light which is
detected by a photomultiplier, the specimen scanning control and signal
processing are finished by a low - cost and handy single- board
microcomputer. The theory that applies the scanning frequency
spectrum method , the method for determining flaw size and measuring sensitivity as well as control
model for various specimen are analysed in detail .A system has been built according to
the idea discribed above. By using the system, several specimen are measured, the comparison
and analysis between exprimental results and actual flaw conditions are given. The minimum
detectable flaw is 3 micrometer, the measuring error is also given.
Paper Details
Date Published: 1 January 1991
PDF: 8 pages
Proc. SPIE 1332, Optical Testing and Metrology III: Recent Advances in Industrial Optical Inspection, (1 January 1991); doi: 10.1117/12.51051
Published in SPIE Proceedings Vol. 1332:
Optical Testing and Metrology III: Recent Advances in Industrial Optical Inspection
Chander Prakash Grover, Editor(s)
PDF: 8 pages
Proc. SPIE 1332, Optical Testing and Metrology III: Recent Advances in Industrial Optical Inspection, (1 January 1991); doi: 10.1117/12.51051
Show Author Affiliations
GuoGuang Yang, Zhejiang Univ. (China)
Wenliang Gao, Zhejiang Univ. (United States)
Wenliang Gao, Zhejiang Univ. (United States)
Shangyi Cheng, Zhejiang Univ. (China)
Published in SPIE Proceedings Vol. 1332:
Optical Testing and Metrology III: Recent Advances in Industrial Optical Inspection
Chander Prakash Grover, Editor(s)
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