Share Email Print

Proceedings Paper

Research on application of special filter in projecting grating profilometry
Author(s): Jianqiang Xu; Yunshan Wang; Shuchun Si; Chengyong Gao; Dazhen Yun
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

In 3D projecting grating profilometry, we are often persecuted by some disgusted phenomenon of images, such as reflecting flare, overlapping of grating and other noise. All these can bring a bigger error in image processing. The intention of this paper is to propose some special filter and other methods of image processing. The technique we applied is based on peculiarity of projecting grating profilometry image, which has obvious directionality. We used the nonsymmetrical multi band-pass filters to reject the high frequency noise along the grating and other component except base frequency part. The result obtained from the processed image by multi band-pass filter is much better than that from primary image. The method is propitious to measure some smooth surfaces.

Paper Details

Date Published: 29 April 2003
PDF: 6 pages
Proc. SPIE 5058, Optical Technology and Image Processing for Fluids and Solids Diagnostics 2002, (29 April 2003); doi: 10.1117/12.510276
Show Author Affiliations
Jianqiang Xu, Shandong Univ. of Technology (China)
Dalian Univ. of Technology (China)
Yunshan Wang, Shandong Univ. of Technology (China)
Shuchun Si, Shandong Univ. of Technology (China)
Chengyong Gao, Shandong Univ. of Technology (China)
Dazhen Yun, Dalian Univ. of Technology (China)

Published in SPIE Proceedings Vol. 5058:
Optical Technology and Image Processing for Fluids and Solids Diagnostics 2002
Gong Xin Shen; Soyoung S. Cha; Fu-Pen Chiang; Carolyn R. Mercer, Editor(s)

© SPIE. Terms of Use
Back to Top
Sign in to read the full article
Create a free SPIE account to get access to
premium articles and original research
Forgot your username?