Proceedings Paper
Characterization of planar optical waveguides by K+ ion exchange in glass at 1.152 and 1.523 um| Format | Member Price | Non-Member Price |
|---|---|---|
| $17.00 | $21.00 |
Paper Abstract
The WKB relation and mode indices measurement have been used to determine the important surface index change and effective depth of planar K+-ion exchanged waveguides in soda-lime glass at 1.152 and 1.523 mm for any given set of fabrication temperature and time, whereas the substrate index can be determined by a multi-layer Brewster angle measurement. The data obtained are important in the design and fabrication of K+-ion exchanged waveguides in single-mode fiber systems at 1.3 and 1.55 pm.
Paper Details
Date Published: 1 December 1991
PDF: 5 pages
Proc. SPIE 1583, Integrated Optical Circuits, (1 December 1991); doi: 10.1117/12.50870
Published in SPIE Proceedings Vol. 1583:
Integrated Optical Circuits
Ka Kha Wong, Editor(s)
PDF: 5 pages
Proc. SPIE 1583, Integrated Optical Circuits, (1 December 1991); doi: 10.1117/12.50870
Show Author Affiliations
Gar Lam Yip, McGill Univ. (Canada)
Kiyoshi Kishioka, Osaka Electro-Communication Univ. (Japan)
Kiyoshi Kishioka, Osaka Electro-Communication Univ. (Japan)
Feng Xiang, McGill Univ. (Canada)
J. Y. Chen, McGill Univ. (Canada)
J. Y. Chen, McGill Univ. (Canada)
Published in SPIE Proceedings Vol. 1583:
Integrated Optical Circuits
Ka Kha Wong, Editor(s)
© SPIE. Terms of Use
