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Proceedings Paper

Real-time data processor for the COMPASS hyperspectral sensor system
Author(s): William E. Schaff; Anthony Copeland; Mike Steffen; Rory O'Connor; Christopher Simi; Jerry Zadnik; Ed M. Winter; Glenn Healey
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Paper Abstract

The NVESD COMPASS instrument is an airborne dispersive hyperspectral imager that covers the VNIR through SWIR bands and incorporates a real-time data processing system. The processing system consists of a Data Processing Computer (DPC) and an Operator Display/Control Computer (ODC). The high-performance DPC executes real-time sensor calibration and multiple spectral detection algorithms on 13 G4-processors in a Race++ switched backplane. The DPC sends three-band pseudo-color hyperspectral data, high-resolution target chips, and GPS/INS data to the ODC. The ODC outputs a geo-registered display of HSI color imagery with detection cue overlays. The COMPASS detection algorithms, which are particularly well suited to CC&D targeting applications, include the SSRX spectral anomaly detector, the NFINDR/STD spectral unmixing-based anomaly detector, (3) a supervised spectral matched filter (SSMF), and (4) Healey's invariant subspace detector. The DPC airborne component is VME-based in a compact, ruggedized chassis. The COMPASS real-time processor is a second generation system based on NRL-sponsored WarHORSE demonstrations. This paper reviews the DPC system design, capabilities and performance.

Paper Details

Date Published: 7 January 2004
PDF: 13 pages
Proc. SPIE 5159, Imaging Spectrometry IX, (7 January 2004); doi: 10.1117/12.508570
Show Author Affiliations
William E. Schaff, Space Computer Corp. (United States)
Anthony Copeland, Space Computer Corp. (United States)
Mike Steffen, Space Computer Corp. (United States)
Rory O'Connor, Space Computer Corp. (United States)
Christopher Simi, U.S. Army Night Vision and Electronic Sensors Directorate (United States)
Jerry Zadnik, E-OIR Measurements Inc. (United States)
Ed M. Winter, Technical Research Associates, Inc. (United States)
Glenn Healey, Hypertech Systems (United States)

Published in SPIE Proceedings Vol. 5159:
Imaging Spectrometry IX
Sylvia S. Shen; Paul E. Lewis, Editor(s)

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