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Reflection and transmission scattering by rough plane surface of glass hemisphere
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Paper Abstract

Polarization of both Reflection and transmission scatterings by a rough plane surface of a glass hemisphere with a smooth spherical surface were measured. Null ellipsometry was used to measure the ellipsometric parameters and depolarization. Linear polarization, circular polarization, and principal Mueller matrix were obtained from the above measured quantities. Scattering was measured at fixed incident and detection directions, and variable sample orientation. The scattering and its polarization and depolarization are symmetric with the off-specular angle (OSA). The measured linear polarization increases with increasing OSA, and may change sign for large OSA. Reflection scattering shows more depolarization than the transmission scattering and so do the deviations from the specular values for all parameters.

Paper Details

Date Published: 16 October 2003
PDF: 10 pages
Proc. SPIE 5189, Surface Scattering and Diffraction III, (16 October 2003); doi: 10.1117/12.507780
Show Author Affiliations
Soe-Mie F. Nee, Naval Air Warfare Ctr. (United States)
Tsu-Wei Nee, Naval Air Warfare Ctr. (United States)

Published in SPIE Proceedings Vol. 5189:
Surface Scattering and Diffraction III
Zu-Han Gu; Alexei A. Maradudin, Editor(s)

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