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Proceedings Paper

Instant measurement of phase-characteristic curve
Author(s): Lev S. Sadovnik; Chris C. Rich
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Paper Abstract

A fast method of diagnosing a phase characteristic curve for a variety of phase recording materials is proposed. A sinusoidal test pattern is printed onto a phase recording material that is illuminated through a continuous neutral density filter. The sample is then placed at the entrance of a 2-F coherent system, and the intensities of selected diffraction orders are observed. By comparison of the output intensity distribution with a predicted one, a curve of phase vs. exposure energy for the photosensitive material can be immediately calculated. This paper considers both surface relief modulation materials and volume optical index modulation media. Experimental measurements on DCG material show that extremely high input dynamic range (up to 3 orders of magnitude) can be obtained with standard processing.

Paper Details

Date Published: 1 December 1991
PDF: 5 pages
Proc. SPIE 1559, Photopolymer Device Physics, Chemistry, and Applications II, (1 December 1991); doi: 10.1117/12.50691
Show Author Affiliations
Lev S. Sadovnik, Physical Optics Corp. (United States)
Chris C. Rich, Physical Optics Corp. (United States)

Published in SPIE Proceedings Vol. 1559:
Photopolymer Device Physics, Chemistry, and Applications II
Roger A. Lessard, Editor(s)

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