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Proceedings Paper

EUV multilayers for solar physics
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Paper Abstract

We present an overview of currently available EUV multilayer coatings that can be used for the construction of solar physics instrumentation utilizing normal-incidence optics. We describe the performance of a variety of Si-based multilayers, including Si/B4C and new Si/SiC films that provide improved performance in the wavelength range from 25 n 35 nm, as well as traditional Si/Mo multilayers, including broad-band coatings recently developed for the Solar-B/EIS instrument. We also outline prospects for operation at both longer and shorter EUV wavelengths, and also the potential of ultra-short-period multilayers that work near normal incidence in the soft X-ray region.

Paper Details

Date Published: 29 January 2004
PDF: 11 pages
Proc. SPIE 5168, Optics for EUV, X-Ray, and Gamma-Ray Astronomy, (29 January 2004); doi: 10.1117/12.506175
Show Author Affiliations
David L. Windt, Columbia Univ. (United States)
S. Donguy, Columbia Univ. (United States)
John F. Seely, Naval Research Lab. (United States)
Benjawan Kjornrattanawanich, Universities Space Research Association (United States)
Eric M. Gullikson, Lawrence Berkeley National Lab. (United States)
C. C. Walton, Lawrence Livermore National Lab. (United States)
L. Golub, Smithsonian Astrophysical Observatory (United States)
E. DeLuca, Smithsonian Astrophysical Observatory (United States)

Published in SPIE Proceedings Vol. 5168:
Optics for EUV, X-Ray, and Gamma-Ray Astronomy
Oberto Citterio; Stephen L. O'Dell, Editor(s)

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