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Proceedings Paper

XUV polarimeter for undulator radiation measurements
Author(s): Efim S. Gluskin; J. E. Mattson; Samuel D. Bader; P. James Viccaro; Troy W. Barbee Jr.; Nicholas B. Brookes; Alan A. Pitas; Richard N. Watts
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Paper Abstract

A polarimeter for x-ray and vacuum ultraviolet (XUV) radiation was built to measure the spatial and spectral dependence of the polarization of the light produced by the new undulator at the U5 beamline at NSLS. The fourth-harmonic radiation was measured, and it does not agree with predictions based on ideal simulation codes in the far-field approximation.

Paper Details

Date Published: 1 November 1991
PDF: 13 pages
Proc. SPIE 1548, Production and Analysis of Polarized X Rays, (1 November 1991); doi: 10.1117/12.50573
Show Author Affiliations
Efim S. Gluskin, Argonne National Lab. (United States)
J. E. Mattson, Argonne National Lab. (United States)
Samuel D. Bader, Argonne National Lab. (United States)
P. James Viccaro, Argonne National Lab. (United States)
Troy W. Barbee Jr., Lawrence Livermore National Lab. (United States)
Nicholas B. Brookes, Brookhaven National Lab. (France)
Alan A. Pitas, Baker Manufacturing Co. (United States)
Richard N. Watts, National Institute of Standards and Technology (United States)

Published in SPIE Proceedings Vol. 1548:
Production and Analysis of Polarized X Rays
D. Peter Siddons, Editor(s)

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