Share Email Print

Proceedings Paper

Poly-p-xylylene derivatives as non-solution processible gate dielectric materials for organic field effect transistor
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

A flexible insulator film would be one of the most important elements of flexible organic field-effect transistors (OFETs). It should be produced from a soft organic material rather than a stiff inorganic material. Many polymeric materials were spin-coated from the solution and the resulted films have to be baked or cured to obtain a good insulator. Since those procedures impose a restriction on the OFETs, a fabrication process without using a solvent has been desired. Poly-p-xylylene derivatives have been made into an insulator film by a non-solvent procedure, chemical vapor deposition (CVD). The insulator film has additional advantages, pinhole-free, resistance to many solvents and no thermal stress to a material beneath. We have fabricated and characterized OFETs with the inverted staggered geometry, substrate/ gate electrode/ poly-p-xylylene derivatives/ organic semiconductor/ source-drain electrodes. And the CVD enables to form an insulator film even above the organic semiconductor. So we fabricated the staggered type configuration, substrate/ source-drain electrodes/ organic semiconductor/ poly-chloro-p-xylylene/ gate electrode. The device performance of a staggered type transistor indicated that the molecular arrangement of organic semiconductor at the insulator interface is more dominant than the damage or chemical deterioration due to the attack of the radicals during the CVD procedure.

Paper Details

Date Published: 17 November 2003
PDF: 8 pages
Proc. SPIE 5217, Organic Field Effect Transistors II, (17 November 2003); doi: 10.1117/12.505600
Show Author Affiliations
Takeshi Yasuda, Kyushu Univ. (Japan)
Katsuhiko Fujita, Kyushu Univ. (Japan)
Tetsuo Tsutsui, Kyushu Univ. (Japan)

Published in SPIE Proceedings Vol. 5217:
Organic Field Effect Transistors II
Christos D. Dimitrakopoulos, Editor(s)

© SPIE. Terms of Use
Back to Top
Sign in to read the full article
Create a free SPIE account to get access to
premium articles and original research
Forgot your username?