
Proceedings Paper
Evaluation of the load impedance in coaxial cable via time-frequency domain reflectometryFormat | Member Price | Non-Member Price |
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Paper Abstract
A new impedance measurement methodology based on time-frequency
domain reflectometry (TFDR) is proposed. For the evaluation of the
reflection coefficient in time-frequency domain reflectometry, the
distortion of the reflected wave by the frequency-dependent
attenuation is compensated which otherwise results in inaccurate
impedance measurement. Also, the phase difference between the
incident and reflected waveforms caused by the state of the load
impedance is evaluated by the cross time-frequency distribution
which provides time-frequency localized phase difference
information. The proposed methodology is verified by a set of
numerical electromagnectic simulation experiments and the results
are compared with classical time domain reflectometry (TDR).
Impedance measurement via time-frequency domain reflectometry is
more accurate over a wider range of impedances than TDR.
Paper Details
Date Published: 24 December 2003
PDF: 9 pages
Proc. SPIE 5205, Advanced Signal Processing Algorithms, Architectures, and Implementations XIII, (24 December 2003); doi: 10.1117/12.505379
Published in SPIE Proceedings Vol. 5205:
Advanced Signal Processing Algorithms, Architectures, and Implementations XIII
Franklin T. Luk, Editor(s)
PDF: 9 pages
Proc. SPIE 5205, Advanced Signal Processing Algorithms, Architectures, and Implementations XIII, (24 December 2003); doi: 10.1117/12.505379
Show Author Affiliations
YongJune Shin, Univ. of Texas at Austin (United States)
Edward J. Powers, Univ. of Texas at Austin (United States)
TokSon Choe, Yonsei Univ. (South Korea)
Edward J. Powers, Univ. of Texas at Austin (United States)
TokSon Choe, Yonsei Univ. (South Korea)
Seunghoon Sung, Yonsei Univ. (South Korea)
JongGwan Yook, Yonsei Univ. (South Korea)
JinBae Park, Yonsei Univ. (South Korea)
JongGwan Yook, Yonsei Univ. (South Korea)
JinBae Park, Yonsei Univ. (South Korea)
Published in SPIE Proceedings Vol. 5205:
Advanced Signal Processing Algorithms, Architectures, and Implementations XIII
Franklin T. Luk, Editor(s)
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