Share Email Print

Proceedings Paper

Recent developments of multi-aperture overlap-scanning technique
Author(s): Mingyi Chen; Hongwei Guo; Yingjie Yu; Haitao He
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

In this paper, the multi-aperture overlap-scanning technique (MAOST) and its recent developments are presented. In the first instance, MAOST is used in interferometry, and the principle of MAOST for interferometry is that, a tested large-scale plane is covered by an array of interferometric subapertures, and the relationship between each couple of adjacent subapertures is determined from their overlapping areas by a least squares method, and then the profile of tested plane is obtained by connecting all the subapertures together. Recently, to meet the requirements of advanced manufacturing, the idea of MAOST has been extended to precision three-dimensional (3-D) measurement. In practice, a whole-body 3-D shape is acquired by two steps: first measuring the 3-D shape from different views and afterwards connecting all the views together. In order to accurately determine the position and orientation of every single-view in a common coordinate system, an iterative algorithm based on MAOST concept is utilized.

Paper Details

Date Published: 22 December 2003
PDF: 9 pages
Proc. SPIE 5180, Optical Manufacturing and Testing V, (22 December 2003); doi: 10.1117/12.505340
Show Author Affiliations
Mingyi Chen, Shanghai Univ. (China)
Hongwei Guo, Shanghai Univ. (China)
Yingjie Yu, Shanghai Univ. (China)
Haitao He, Shanghai Univ. (China)

Published in SPIE Proceedings Vol. 5180:
Optical Manufacturing and Testing V
H. Philip Stahl, Editor(s)

© SPIE. Terms of Use
Back to Top
Sign in to read the full article
Create a free SPIE account to get access to
premium articles and original research
Forgot your username?