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Proceedings Paper

Helium neon laser optics: scattered light measurements and process control
Author(s): Bruce E. Perilloux
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Paper Abstract

Output coupler (OC) and high reflector (HR) thin-film coatings and substrates that are employed in 632.8 nm helium-neon (HeNe) lasers are investigated for optical scatter. The measurement of scatter in this paper is in terms of bidirectional reflectance distribution function and calculated total integrated scatter, or BRDF and CTIS, respectively. Laser output power will be briefly reviewed as a function of total scatter loss from the OC and HR. Increasing amounts of loss (scatter), in individual sets of OC's and HR's, reduces the output power of each laser tube from a theoretical optimum output, for the same amount of loss. Sample optics were measured for BRDF and compared with visual microscope inspection. Statistical analysis of many thousands of coated optics provides insight to controlling causes of scatter in the manufacturing process. Here, the average and standard deviation of BRDF scatter data for many optics provide important data for process control. Various scatter data is presented form OC and HR production runs.

Paper Details

Date Published: 1 December 1991
PDF: 8 pages
Proc. SPIE 1530, Optical Scatter: Applications, Measurement, and Theory, (1 December 1991); doi: 10.1117/12.50515
Show Author Affiliations
Bruce E. Perilloux, Coherent, Inc. (United States)

Published in SPIE Proceedings Vol. 1530:
Optical Scatter: Applications, Measurement, and Theory
John C. Stover, Editor(s)

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