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Proceedings Paper

Design considerations for multipurpose bidirectional reflectometers
Author(s): John Ternay Neu; Martin Bressler
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Paper Abstract

A bidirectional reflectometer designed for obtaining both signature data and optical component scattering information must satisfy a wide range of measurement requirements and sometimes conflicting requirements and criteria. The basic definition of bidirectional measurement is reviewed; the design approaches, measurement geometries, measurement procedures and techniques, recommended for a multipurpose instrument are described and discussed.

Paper Details

Date Published: 1 December 1991
PDF: 11 pages
Proc. SPIE 1530, Optical Scatter: Applications, Measurement, and Theory, (1 December 1991); doi: 10.1117/12.50514
Show Author Affiliations
John Ternay Neu, Surface Optics Corp. (United States)
Martin Bressler, Surface Optics Corp. (United States)

Published in SPIE Proceedings Vol. 1530:
Optical Scatter: Applications, Measurement, and Theory
John C. Stover, Editor(s)

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