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Proceedings Paper

Anomalous scattering from optical surfaces with roughness and permittivity perturbations
Author(s): J. Merle Elson
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Paper Abstract

This paper discusses the wavelength dependence of angle resolved scattering (ARS) from optical surfaces, which have surface roughness and dielectric permittivity fluctuations. Such surfaces are assumed to be of 'optical quality' in that the rms roughness is much less that the incident wavelength. Of particular interest is scattering from beryllium optical components. Depending upon fabrication methods, it has been found that ARS measurements from beryllium at visible through infrared wavelengths do not scale as wavelength to the inverse fourth power. This is contrary to first-order roughness scattering theory that predicts a Rayleigh-like wavelength dependence. This indicates that other non-trivial sources of scattering are also in effect. The results of this work show that a surface that scatters due to surface roughness and dielectric permittivity perturbations along with a statistical correlation between these sources can yield a non-Rayleigh wavelength dependence. This can explain the anomalies seen in beryllium scattering and other materials.

Paper Details

Date Published: 1 December 1991
PDF: 12 pages
Proc. SPIE 1530, Optical Scatter: Applications, Measurement, and Theory, (1 December 1991); doi: 10.1117/12.50509
Show Author Affiliations
J. Merle Elson, Naval Weapons Ctr. (United States)


Published in SPIE Proceedings Vol. 1530:
Optical Scatter: Applications, Measurement, and Theory
John C. Stover, Editor(s)

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