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Proceedings Paper

Study of anomalous scatter characteristics
Author(s): John C. Stover; Marvin L. Bernt; Timothy D. Henning
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Paper Abstract

Anomalous, or non-topographic, scatter from beryllium optics at IR wavelengths has been recognized as a source of poor performance for space based IR imaging systems. This paper reports the results of experiments designed to discover clues as to the source of anomalous scatter so that it can be eliminated with new manufacturing techniques. Polarization, wavelength dependence and surface pitting were examined. None of these can be confirmed as the primary source of anomalous scatter based on the work completed to date.

Paper Details

Date Published: 1 December 1991
PDF: 11 pages
Proc. SPIE 1530, Optical Scatter: Applications, Measurement, and Theory, (1 December 1991); doi: 10.1117/12.50508
Show Author Affiliations
John C. Stover, TMA Technologies, Inc. (United States)
Marvin L. Bernt, TMA Technologies, Inc. (United States)
Timothy D. Henning, TMA Technologies, Inc. (United States)

Published in SPIE Proceedings Vol. 1530:
Optical Scatter: Applications, Measurement, and Theory
John C. Stover, Editor(s)

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