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Proceedings Paper

Appearance characterization by a scatterometer employing a hemispherical screen
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Paper Abstract

Characterization of optical appearance by measurement of the hemispherical scattering distribution using a concave projection screen and a camera is investigated. Secondary intensities by repeated internal screen reflections can be measured separately and compensated for. The concept is coupled to functional properties of product surfaces and we use it in an industrial environment. Only little less accurate than a photogoniometer, the hardware is much cheaper, contains no moving parts and is up to 1000 times faster.

Paper Details

Date Published: 16 October 2003
PDF: 11 pages
Proc. SPIE 5189, Surface Scattering and Diffraction III, (16 October 2003); doi: 10.1117/12.503560
Show Author Affiliations
Sipke Wadman, Philips Ctr. for Industrial Technology (Netherlands)
Stefan Baumer, Philips Ctr. for Industrial Technology (Netherlands)

Published in SPIE Proceedings Vol. 5189:
Surface Scattering and Diffraction III
Zu-Han Gu; Alexei A. Maradudin, Editor(s)

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