Proceedings Paper
Research of hybrid dispersion compensation fiber Raman amplifier| Format | Member Price | Non-Member Price |
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Paper Abstract
The operation principle and model of hybrid FRA is discussed. Hybrid FRA consisting of general fiber G652 and DCF includes DCT + G652, G652 + DCF and G652 + DCF + G652. The optimum design of hybrid FRA has been done by using optimum design software of FRA--OptiAmplifier 3.03. The best structure is G652 + DCF. It has many advantages: dispersion compensation of network, wide operation wavelength range (That depend on pump laser wavelength). The configuration has been set up and researched. Using Raman laser (1427nm) as an excited source, Raman gain spectrum of optical fiber and small signal amplification spectrum of is measured by optical spectrum analyzer Q8384. The hybrid FRA has gain bandwidths of 88nm in S and C band. It will increase the transmission channels of fiber communication network.
Paper Details
Date Published: 17 June 2003
PDF: 6 pages
Proc. SPIE 5129, Fundamental Problems of Optoelectronics and Microelectronics, (17 June 2003); doi: 10.1117/12.502263
Published in SPIE Proceedings Vol. 5129:
Fundamental Problems of Optoelectronics and Microelectronics
Yuri N. Kulchin; Oleg B. Vitrik, Editor(s)
PDF: 6 pages
Proc. SPIE 5129, Fundamental Problems of Optoelectronics and Microelectronics, (17 June 2003); doi: 10.1117/12.502263
Show Author Affiliations
Shangzhong Jin, China Institute of Metrology (China)
Zhejiang Univ. (China)
Wen Zhou, Zhejiang Univ. (China)
Zaixuan Zhang, China Institute of Metrology (China)
Tao Liu, China Institute of Metrology (China)
Zhejiang Univ. (China)
Wen Zhou, Zhejiang Univ. (China)
Zaixuan Zhang, China Institute of Metrology (China)
Tao Liu, China Institute of Metrology (China)
Jianfeng Xu, China Institute of Metrology (China)
Jianfeng Wang, China Institute of Metrology (China)
Honglin Liu, China Institute of Metrology (China)
Jianfeng Wang, China Institute of Metrology (China)
Honglin Liu, China Institute of Metrology (China)
Published in SPIE Proceedings Vol. 5129:
Fundamental Problems of Optoelectronics and Microelectronics
Yuri N. Kulchin; Oleg B. Vitrik, Editor(s)
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