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Proceedings Paper

Optoelectronic method for noncontact reconstructing 3D objects surface profile of large sizes
Author(s): Yury N. Kulchin; Vladimir P. Vasiliev; Yuri Yu. Nikonov
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Paper Abstract

Optoelectronic method for non-contact reconstructing surface profile of large size 3D objects is investigated in this paper. Optimal parameters for measuring are proposed. It is shown that the given method, as against known, does not require fine tuning of equipment. Numerical method for minimization of errors caused by aberrations distortions is proposed. The step-by-step cells method that allows increasing measurement accuracy.

Paper Details

Date Published: 17 June 2003
PDF: 6 pages
Proc. SPIE 5129, Fundamental Problems of Optoelectronics and Microelectronics, (17 June 2003); doi: 10.1117/12.502158
Show Author Affiliations
Yury N. Kulchin, Far Eastern State Technical Univ. (Russia)
Vladimir P. Vasiliev, Sakhalin State Univ. (Russia)
Yuri Yu. Nikonov, Sakhalin State Univ. (Russia)

Published in SPIE Proceedings Vol. 5129:
Fundamental Problems of Optoelectronics and Microelectronics
Yuri N. Kulchin; Oleg B. Vitrik, Editor(s)

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