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Proceedings Paper

Experimental and theoretical investigation of surface- and bulk-induced attenuation in solution-deposited waveguides
Author(s): Ronald L. Roncone; James J. Burke; Lori Weisenbach; Brian J.J. Zelinski
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Paper Abstract

Experimental measurement of modal attenuation in solution-derived Si02-Ti02 waveguides is compared to the total waveguide attenuation predicted by surface and volume scattering models. The surface scatter model utilizes measurements of the film index and thickness, and the rms roughness and correlation lengths (measured by Atomic Force Microscopy) of the film and substrate surfaces, to facilitate a realistic comparison of theoretical and experimental waveguide attenuation. Theoretical attenuation, calculated by means of a perturbation technique, in conjunction with a stationary phase method, is used to demonstrate the influence of the most important waveguide and microstructural parameters. The plots provide guidelines for acceptable surface roughness and bulk refractive index fluctuations to fabricate low- loss waveguides. Volume-induced scattering is shown to be the dominant loss mechanism in these waveguides.

Paper Details

Date Published: 1 November 1991
PDF: 12 pages
Proc. SPIE 1590, Submolecular Glass Chemistry and Physics, (1 November 1991); doi: 10.1117/12.50197
Show Author Affiliations
Ronald L. Roncone, Optical Sciences Ctr./Univ. of Arizona (United States)
James J. Burke, Optical Sciences Ctr./Univ. of Arizona (United States)
Lori Weisenbach, Univ. of Arizona (United States)
Brian J.J. Zelinski, Univ. of Arizona (United States)

Published in SPIE Proceedings Vol. 1590:
Submolecular Glass Chemistry and Physics
Phillip Bray; Norbert J. Kreidl, Editor(s)

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