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Proceedings Paper

High-speed optical outer-diameter gauge for digital wire manufacture on-line measurement with laser and CCD technology
Author(s): Hong Zhao; Xuan Wang; Rui Wang
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Paper Abstract

In this paper, development of a novel optical diameter gauge is described. In order to eliminate the influence of wire vibration in the high moving speed, the semiconductor laser diode with 1.2μs exposure time aperture were used to be the illuminating light soruces, a CCD-lien sensors wtih 5000 elements and 7μm*7μm element area were applied to guage the diameter of the object. Data acquistion unit consists of high speed A/D converter, single chip processor, DMA and SRAM to process the signal data digitally in order to gain the high accuracy. The instrument obtained 0.7μm on line dynamic accuracy finally.

Paper Details

Date Published: 17 June 2003
PDF: 7 pages
Proc. SPIE 5129, Fundamental Problems of Optoelectronics and Microelectronics, (17 June 2003); doi: 10.1117/12.501671
Show Author Affiliations
Hong Zhao, Harbin Univ. of Science and Technology (China)
Xuan Wang, Harbin Univ. of Science and Technology (China)
Rui Wang, Harbin Univ. of Science and Technology (China)

Published in SPIE Proceedings Vol. 5129:
Fundamental Problems of Optoelectronics and Microelectronics
Yuri N. Kulchin; Oleg B. Vitrik, Editor(s)

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