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Proceedings Paper

Methods for analysis of optical parameters of waveguide resonator with local inhomogeneity
Author(s): Vladimir A. Saetchnikov; Elina A. Tcherniavskaia; Gerhard Schiffner
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Paper Abstract

Results of theoretical and experimental investigation of optical parameters of slab guide resonators used in industrial lasers of the middle IR rang with radio-frequency pumping and output power from 200 W up to 4.5 kW are given. The measurements were carried out with the help of the automated system on the basis of scanning interferometer of the middle IR range supplied by high precision positioning system. Significant (two, three times and more) variation of optical losses in the resonator under small (down to several micrometers) change of its geometry has been found out experimentally. Replacement of a material or use of dielectric covering of the electrode surfaces has been followed not only the change of an average level of optical losses due to complex index of refraction, but also rather complex variation of their dependence on geometry of the resonator. It was shown experimentally that absolute value and character of dependence of optical losses on resonator geometry can change drastically with variation of the roughness of electrode surface. For example nearly smooth surfaces (with the deepness of the roughness of some nm) are not optimum for minimal optical losses. The best results can be obtained for a structure of a surface of electrodes representing periodic or random structure (depending on electrode material or its dielectric covering) with depth of around a radiation wavelength.

Paper Details

Date Published: 19 June 2003
PDF: 10 pages
Proc. SPIE 5066, Lasers for Measurements and Information Transfer 2002, (19 June 2003); doi: 10.1117/12.501547
Show Author Affiliations
Vladimir A. Saetchnikov, Belarussian State Univ. (Belarus)
Elina A. Tcherniavskaia, Belarussian State Univ. (Belarus)
Gerhard Schiffner, Ruhr-Univ. Bochum (Germany)

Published in SPIE Proceedings Vol. 5066:
Lasers for Measurements and Information Transfer 2002
Vadim E. Privalov, Editor(s)

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