Share Email Print

Proceedings Paper

Regression analysis for wavefront fitting with Zernike polynomials
Author(s): Bo Qi; Hongbin Chen; Jiaguang Ma; Nengli Dong
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

Many approaches to compute the wavefront of interferometer have been devised, for example least squares method, Gram-Schmidt method, covariance matrix method and SVD method, but one of the most interesting is based on the Zernike Polynomials. Zernike polynomials are ideal for fitting the measured data points in a wavefront to a two-dimensional polynomial, due to their orthogonal properties. The key problem of wavefront fitting is how to express exactly the whole wavefront. In established algorithms, the fixed mode number of Zernike polynomials is used, for example most analyzing software using 36 Zernike polynomials (i.e., Metropro of Zygo). When analyzing high spatial frequency aberrations, the analyzed result is not accurate. We develop a method of wavefront fitting with regression analysis. Regression analysis is the most widely used technique in statistics, and it is a statistical technique for investigating and modeling the relationship between variables. With stepwise regression we obtain the optimum combination of mode, and the wavefront can be exactly expressed.

Paper Details

Date Published: 22 December 2003
PDF: 8 pages
Proc. SPIE 5180, Optical Manufacturing and Testing V, (22 December 2003); doi: 10.1117/12.501144
Show Author Affiliations
Bo Qi, Institute of Optics and Electronics (China)
Hongbin Chen, Institute of Optics and Electronics (China)
Jiaguang Ma, Institute of Optics and Electronics (China)
Nengli Dong, Institute of Optics and Electronics (China)

Published in SPIE Proceedings Vol. 5180:
Optical Manufacturing and Testing V
H. Philip Stahl, Editor(s)

© SPIE. Terms of Use
Back to Top
Sign in to read the full article
Create a free SPIE account to get access to
premium articles and original research
Forgot your username?