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Proceedings Paper

Optical design of rotationally symmetric triangulation sensors with low-cost detectors based on reflective optics
Author(s): Peter Ott
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Paper Abstract

Classical triangulation sensors exhibit an orientation depend signal if the scattering properties of the work-piece are not symmetrical like at curved surface locations. This problem is avoided by rotational symmetric triangulation sensors. Due to this attractive property in a lot of applications such a sensor was introduced very recently on the market. This sensor is based on refractive optics and a special PSD detector, both custom made resulting in high costs. Additionally, the existing optical design approach does not offer an optical layout to start with, thus a good amount of trial and error is required and non-optimal solutions are probable. Therefore, there is great interest for a clear optical design strategy that results in layouts that are suitable also to use low cost commercial available detectors, such as CCD or CMOS image detectors. In this paper such a design procedure is presented for optical designs that use reflecting optical surfaces. Several solutions are depicted and discussed. The designs are not only attractive from the optical point of view and from detector considerations, but also from opto-mechanical design issues. For example designs with only one opto-mechanical part are possible. The resulting optical designs consist of aspherical surfaces which are obtained directly by using only some new relations of first order optics for off-axis objects. The designs are validated by exact ray tracing. These ray tracing results show already very good performance. Nevertheless, it was possible to further optimize the optical designs very efficiently using ray tracing software, thus yielding improved optical properties.

Paper Details

Date Published: 30 May 2003
PDF: 10 pages
Proc. SPIE 5144, Optical Measurement Systems for Industrial Inspection III, (30 May 2003); doi: 10.1117/12.500477
Show Author Affiliations
Peter Ott, Fachhochschule Heilbronn (Germany)

Published in SPIE Proceedings Vol. 5144:
Optical Measurement Systems for Industrial Inspection III
Wolfgang Osten; Malgorzata Kujawinska; Katherine Creath, Editor(s)

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