Share Email Print

Proceedings Paper

Polarization phase shifting in white-light interferometry
Author(s): S. Suja Helen; Mahendra P. Kothiyal; Rajpal S. Sirohi
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

In applications of surface profilometry with white light interferometry (WLI), the detection of the peak of the fringe contrast function is of prime importance. Several procedures have been proposed for the determination of the fringe contrast function. Fourier transform technique and phase shifting technique are two important methods. In the Fourier transform technique, the interference pattern is scanned to obtain the interference signal which is then subjected to filtering in the frequency domain. This involves two discrete Fourier transform operations. The phase shifting technique makes use of the algorithms introduced in the monochromatic interferometry for the calculation of the fringe contrast function. Both PZT and polarization phase shifters are proposed to be used for WLI. In this paper, it will be shown that polarization phase shifter offers some advantages over PZT phase shifter.

Paper Details

Date Published: 7 March 2006
PDF: 10 pages
Proc. SPIE 4101, Laser Interferometry X: Techniques and Analysis, (7 March 2006); doi: 10.1117/12.498448
Show Author Affiliations
S. Suja Helen, Indian Institute of Technology/Madras (India)
Mahendra P. Kothiyal, Indian Institute of Technology/Madras (India)
Rajpal S. Sirohi, Indian Institute of Technology/Madras (India)

Published in SPIE Proceedings Vol. 4101:
Laser Interferometry X: Techniques and Analysis
Gordon M. Brown; Malgorzata Kujawinska; Werner P. O. Jueptner; Ryszard J. Pryputniewicz; Ryszard J. Pryputniewicz; Mitsuo Takeda, Editor(s)

© SPIE. Terms of Use
Back to Top
Sign in to read the full article
Create a free SPIE account to get access to
premium articles and original research
Forgot your username?