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Proceedings Paper

Measurement and control of the bending of x-ray mirrors using speckle interferometry
Author(s): Pierre M. Jacquot; Massimo Facchini; Muriel Mattenet; Gerhard Gruebel
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Paper Abstract

Speckle interferometry (SI) is used for the measurement of the shape change of x-ray mirrors. Initially flat under thermal equilibrium, the mirror, or "thermal bender", is deliberately and adaptively bent by means of well-controlled temperature gradients. As the deflection of an optically polished surface can be obtained by a number of methods, the choice of SI and its subsequent advantages are discussed. Quantitative results are reported, referring to four kinds of tests: conformity, stability, sensitivity and repeatability tests. SI is recognized to meet the expectations: it provides a simple, complete, sensitive and accurate control of the shape of the bent x-ray mirrors.

Paper Details

Date Published: 7 March 2006
PDF: 9 pages
Proc. SPIE 4101, Laser Interferometry X: Techniques and Analysis, (7 March 2006); doi: 10.1117/12.498444
Show Author Affiliations
Pierre M. Jacquot, Swiss Federal Institute of Technology/Lausanne (Switzerland)
Massimo Facchini, Swiss Federal Institute of Technology/Lausanne (Switzerland)
Muriel Mattenet, European Synchrotron Radiation Facility (France)
Gerhard Gruebel, European Synchrotron Radiation Facility (France)

Published in SPIE Proceedings Vol. 4101:
Laser Interferometry X: Techniques and Analysis
Gordon M. Brown; Malgorzata Kujawinska; Werner P. O. Jueptner; Ryszard J. Pryputniewicz; Ryszard J. Pryputniewicz; Mitsuo Takeda, Editor(s)

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