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Proceedings Paper

Scattering-parameters characterization of microwave photonics networks
Author(s): Laurent Abbal; Jean-Claude Mollier
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Paper Abstract

As the use of opto-microwave systems having microwave modulation bandwidth is increasing, the efficient measurement of opto-electronic S-parameters will be very useful to their overall design and characterization. A new generation of tools is required for the measurement of fundamentals parameters such as the microwave frequency response, bandwidth, gain and return loss of microwave photonic components. Current lightwave measurement techniques are primitive when compared with conventional RF and microwave network analysis. A solution for accurate measurements is a system based on the development of an automated bilateral calibration which could be implemented into a millimeter network analyzer (modulation frequency exceeding 20GHz) in order to fully characterize some optical and opto-electronic components. This lightwave network analysis is based on the microwave modulation response of optical components and optical fibres as lines of transmission, which require technologically compatible standards of calibration, along with an extended definition of S-parameters.

Paper Details

Date Published: 8 July 2003
PDF: 5 pages
Proc. SPIE 5036, Photonics, Devices, and Systems II, (8 July 2003); doi: 10.1117/12.498368
Show Author Affiliations
Laurent Abbal, Ecole Nationale Superieure de l'Aeronautique et de l'Espace (France)
Jean-Claude Mollier, Ecole Nationale Superieure de l'Aeronautique et de l'Espace (France)

Published in SPIE Proceedings Vol. 5036:
Photonics, Devices, and Systems II
Miroslav Hrabovsky; Dagmar Senderakova; Pavel Tomanek, Editor(s)

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