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Proceedings Paper

End-pumped thin-rod Yb:YAG amplifier for laser processing
Author(s): S. Takasaki; Y. Tsujioka; M. Fukuda; S. Matsubara; Sakae Kawato; Takao Kobayashi
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Paper Abstract

The Yb (ytterbium) laser material is promising for high-power all-solid-state ultrashort pulse lasers because of its high quantum efficiency and wide gain spectrum. A didoe end-pumped technology is developed for high-average-power and efficient all-solid state ultrashort pulse lasers with high beam quality output. Two 100 W CW-LDs are used for pumping and the beams are focused on the end surfaces of a thin and long Yb:YAG rod. A pair of parallel side surfaces of the rod is placed in contact with cupper heat sinks to remove heat. A one-dimensional distribution of thermal stress induced birefringence was observed in the rod by this simple heat flow. The loss due to thermal birefringence was measured to be smaller than 3%, when the probe beam was linearly polarized in parallel or perpendicular to the direction of cooling. It can be expected theoretically that a moderate single-path gain of 4 for efficient amplification and the optical conversion efficiency of 50% are realized for multimode operation with a pump power of 200 W. In the experiment, output power was measured to be 55 W with beam quality factor of Mx2 x My2 = 5.5 x 6.0 and 27 W with Mx2 x My2 = 1.3 x 1.4 for simple plane-plane linear cavity configuration with no thermal lens compensations.

Paper Details

Date Published: 3 March 2003
PDF: 6 pages
Proc. SPIE 4831, First International Symposium on High-Power Laser Macroprocessing, (3 March 2003); doi: 10.1117/12.497932
Show Author Affiliations
S. Takasaki, Fukui Univ. (Japan)
Y. Tsujioka, Fukui Univ. (Japan)
M. Fukuda, Fukui Univ. (Japan)
S. Matsubara, Fukui Univ. (Japan)
Sakae Kawato, Fukui Univ. (Japan)
Takao Kobayashi, Fukui Univ. (Japan)

Published in SPIE Proceedings Vol. 4831:
First International Symposium on High-Power Laser Macroprocessing
Isamu Miyamoto; Kojiro F. Kobayashi; Koji Sugioka; Reinhart Poprawe; Henry Helvajian, Editor(s)

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