Proceedings Paper
Electromagnetic wave reflection by rough fractal surface of semiconductor materials| Format | Member Price | Non-Member Price |
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Paper Abstract
In the given work the rough surface of semiconductor is modeling by 2D fractal Wierstrass function. On the basis of the Kirchhoff scalar theory the scattering indicatrices for the some types od scattering surfaces are present. On the basis of numerical accounts average scattering coefficient the diagrams of dependence for various fractal semiconductor surfaces was constructed.
Paper Details
Date Published: 1 April 2003
PDF: 8 pages
Proc. SPIE 5024, Selected Papers on Optics and Photonics: Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics, (1 April 2003); doi: 10.1117/12.497262
Published in SPIE Proceedings Vol. 5024:
Selected Papers on Optics and Photonics: Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics
Sergey V. Svechnikov; Mikhail Ya. Valakh, Editor(s)
PDF: 8 pages
Proc. SPIE 5024, Selected Papers on Optics and Photonics: Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics, (1 April 2003); doi: 10.1117/12.497262
Show Author Affiliations
Leonid G. Grechko, Institute of Surface Chemistry (Ukraine)
Olexander Yu. Semchuk, Institute of Surface Chemistry (Ukraine)
Olexander Yu. Semchuk, Institute of Surface Chemistry (Ukraine)
Victor V. Gozhenko, Institute of Surface Chemistry (Ukraine)
Anatolii A. Pinchuk, Institute of Surface Chemistry (Ukraine)
Anatolii A. Pinchuk, Institute of Surface Chemistry (Ukraine)
Published in SPIE Proceedings Vol. 5024:
Selected Papers on Optics and Photonics: Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics
Sergey V. Svechnikov; Mikhail Ya. Valakh, Editor(s)
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