Share Email Print

Proceedings Paper

Electric conduction mechanism in conjugated polymers studied using flicker noise spectroscopy
Author(s): Vitali P. Parkhutik; Rahul Patil; Yutaka Harima
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

Spectroscopy of Stochastic Signals (3S) has been used to study conduction behavior in electrochemically deposited conductive polymers (CP) using as example polyaniline and poly(3-methyl thiophene). Within the 3S approach, the conduction process is considered as a stochastic process in heterogeneous disordered system rather than as some classical conduction mechanisms like Schottky or Poole-Frenkel emission. We have been able to distinguish several modes of the conduction process in conducting polymers using the 3S methodology. Particularly, we have established that the transport of charge carriers in highly doped CPs is much less correlated than in non-doped ones, that is, at low doping levels elementary processes involved in the conduction are more correlated than in highly doped polymer. By increasing applied electric field we also achieve lower correlation in a sequence of elementary events contributing to the conductivity of CP. Apparently, the change in the correlation length corresponds to changing mechanism of the electrical conduction. The lower correlation in highly doped sample can be attributed to various factors including change in CP conformation, enhancement in inter-chain charge transfer and generation of polaron lattice. The obtained results show the high informative potential of the 3S method in studying conduction mechanism in conducting polymers.

Paper Details

Date Published: 9 May 2003
PDF: 8 pages
Proc. SPIE 5112, Noise as a Tool for Studying Materials, (9 May 2003); doi: 10.1117/12.496984
Show Author Affiliations
Vitali P. Parkhutik, Technical Univ. of Valencia (Spain)
Rahul Patil, Hiroshima Univ. (Japan)
Yutaka Harima, Hiroshima Univ. (Japan)

Published in SPIE Proceedings Vol. 5112:
Noise as a Tool for Studying Materials
Michael B. Weissman; Nathan E. Israeloff; A. Shulim Kogan, Editor(s)

© SPIE. Terms of Use
Back to Top