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Proceedings Paper

Multi-image registration for an enhanced vision system
Author(s): Glenn D. Hines; Zia-ur Rahman; Daniel J. Jobson; Glenn A. Woodell
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Paper Abstract

An Enhanced Vision System (EVS) utilizing multi-sensor image fusion is currently under development at the NASA Langley Research Center. The EVS will provide enhanced images of the flight environment to assist pilots in poor visibility conditions. Multi-spectral images obtained from a short wave infrared (SWIR), a long wave infrared (LWIR), and a color visible band CCD camera, are enhanced and fused using the Retinex algorithm. The images from the different sensors do not have a uniform data structure: the three sensors not only operate at different wavelengths, but they also have different spatial resolutions, optical fields of view (FOV), and bore-sighting inaccuracies. Thus, in order to perform image fusion, the images must first be co-registered. Image registration is the task of aligning images taken at different times, from different sensors, or from different viewpoints, so that all corresponding points in the images match. In this paper, we present two methods for registering multiple multi-spectral images. The first method performs registration using sensor specifications to match the FOVs and resolutions directly through image resampling. In the second method, registration is obtained through geometric correction based on a spatial transformation defined by user selected control points and regression analysis.

Paper Details

Date Published: 8 August 2003
PDF: 11 pages
Proc. SPIE 5108, Visual Information Processing XII, (8 August 2003); doi: 10.1117/12.496917
Show Author Affiliations
Glenn D. Hines, NASA Langley Research Ctr. (United States)
Zia-ur Rahman, College of William and Mary (United States)
Daniel J. Jobson, NASA Langley Research Ctr. (United States)
Glenn A. Woodell, NASA Langley Research Ctr. (United States)

Published in SPIE Proceedings Vol. 5108:
Visual Information Processing XII
Zeno J. Geradts; Zia-ur Rahman; Lenny I. Rudin; Robert A. Schowengerdt; Stephen E. Reichenbach, Editor(s)

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