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Proceedings Paper

Some applications of a HOE-based desensitized interferometer in materials research
Author(s): Pierre Michel Boone; Pierre M. Jacquot
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Paper Abstract

A holographic method suited for the measurement of flatness deviation is presented. This method takes advantage of the basic Fizeau arrangement usually meant for contouring analysis of relatively flat bodies. A desensitized interferometer is described allowing the measurement of rough objects, as frequently encountered in engineering practice. The key component of this interferometer is a diffractive optical element produced by recording two-wave interference patterns. Desensitization factors ranging from 1 to 100 with respect to a Fizeau interferometer can be achieved. Flatness checks of computer disks demonstrate the possibilities of the interferometer; deformation measurements performed with the desensitized interferometer on classical experimental mechanics specimens are presented: static testing on notched C-rings and on welds, and fatigue testing on notched three-point bend tests.

Paper Details

Date Published: 1 December 1991
Proc. SPIE 1554, Second International Conference on Photomechanics and Speckle Metrology, (1 December 1991); doi: 10.1117/12.49573
Show Author Affiliations
Pierre Michel Boone, Univ. of Gent (Belgium)
Pierre M. Jacquot, Swiss Federal Institute of Technology (Switzerland)

Published in SPIE Proceedings Vol. 1554:
Second International Conference on Photomechanics and Speckle Metrology
Fu-Pen Chiang; Fu-Pen Chiang, Editor(s)

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