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Proceedings Paper

Estimating the depth of field of a complex sensor system
Author(s): John M. Hall
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Paper Abstract

A complex sensor system may include imaging optics, detector assemblies, image processing, and display components. The depth of field for such systems is not always best characterized by the optical diffraction or geometric limits, therefore a more comprehensive approach may be necessary. A superset of the Rayleigh optical focus criteria, which includes the effects of all major system components, can be applied to the entire system transfer function in order to conduct a comprehensive depth of field analysis. Examples of this method will be shown for a variety of sensor configurations.

Paper Details

Date Published: 10 October 2003
PDF: 12 pages
Proc. SPIE 5074, Infrared Technology and Applications XXIX, (10 October 2003); doi: 10.1117/12.493060
Show Author Affiliations
John M. Hall, Optics 1, Inc. (United States)

Published in SPIE Proceedings Vol. 5074:
Infrared Technology and Applications XXIX
Bjorn F. Andresen; Gabor F. Fulop, Editor(s)

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