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Proceedings Paper

Using X-band weather radar measurements to monitor the integrity of digital elevation models for synthetic vision systems
Author(s): Steven D. Young; Maarten Uijt de Haag; Jonathon Sayre
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Paper Abstract

Synthetic Vision Systems (SVS) provide pilots with displays of stored geo-spatial data representing terrain, obstacles, and cultural features. As comprehensive validation is impractical, these databases typically have no quantifiable level of integrity. Futher, updates to the databases may not be provided as changes occur. These issues limit the certification level and constrain the operational context of SVS for civil aviation. Previous work demonstrated the feasibility of using a real-time monitor to bound the integrity of Digital Elevation Models (DEMs) by using radar altimeter measurements during flight. This paper describes an extension of this concept to include X-band Weather Radar (WxR) measurements. This enables the monitor to detect additional classes of DEM errors and to reduce the exposure time associated with integrity threats. Feature extraction techniques are used along with a statistical assessment of similarity measures between the sensed and stored features that are detected. Recent flight-testing in the area around Juneau, Alaska Airport (JNU) has resulted in a comprehensive set of sensor data that is being used to assess the feasibility of the proposed monitor technology. Initial results of this assessment are presented.

Paper Details

Date Published: 23 September 2003
PDF: 11 pages
Proc. SPIE 5081, Enhanced and Synthetic Vision 2003, (23 September 2003);
Show Author Affiliations
Steven D. Young, NASA Langley Research Ctr. (United States)
Maarten Uijt de Haag, Ohio Univ. (United States)
Jonathon Sayre, Ohio Univ. (United States)

Published in SPIE Proceedings Vol. 5081:
Enhanced and Synthetic Vision 2003
Jacques G. Verly, Editor(s)

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