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Proceedings Paper

Displacement measurement in building model by speckle photography technique
Author(s): Rolando Gonzalez-Pena; Rosa M. Cibrian-Ortiz de Anda; Beatriz Moreno Maso; Carlos Llanes Buron
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Paper Abstract

Speckle photography is a powerful tool adequate to determine small displacements, in micrometer range. Through this information, other characteristics of structure deformation under loads can be determined as stress and strain distribution. In this paper we present the results obtained by applying speckle photography technique to study the behavior of building model. The displacement whole field was obtained by pointwise method. Also we present the strain distribution obtained by finite element method to compare the results obtained by these techniques.

Paper Details

Date Published: 30 May 2003
PDF: 4 pages
Proc. SPIE 5144, Optical Measurement Systems for Industrial Inspection III, (30 May 2003); doi: 10.1117/12.488775
Show Author Affiliations
Rolando Gonzalez-Pena, Instituto Superior Politenico Jose Antonio Echeverria (Cuba)
Rosa M. Cibrian-Ortiz de Anda, Univ. de Valencia (Spain)
Beatriz Moreno Maso, Instituto Superior de Arte (Cuba)
Carlos Llanes Buron, Instituto Superior Politecnico (Cuba)

Published in SPIE Proceedings Vol. 5144:
Optical Measurement Systems for Industrial Inspection III
Wolfgang Osten; Malgorzata Kujawinska; Katherine Creath, Editor(s)

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