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Proceedings Paper

Noise in vortex matter
Author(s): Grzegorz Jung; Y. Paltiel; E. Zeldov; Y. Myasoedov; M. L. Rappaport; Miguel Ocio; Shobo Bhattacharya; M. J. Higgins
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Paper Abstract

The large increase in the flux-flow voltage noise, commonly observed in the vicinity of the peak-effect in superconductors, is ascribed to a novel noise mechanism. The mechanism consists of random injection of the strongly pinned metastable disordered vortex phase through the sample edges and its subsequent random annealing into the weakly pinned ordered phase in the bulk. This results in large critical current fluctuations causing strong vortex velocity fluctuations. The excess noise due to this dynamic admixture of two vortex phases is found to display pronounced reentrant behavior. In the Corbino geometry the injection of the metastable phase is prevented and, accordingly, the excess noise disappears. The excess flux-flow noise in the peak-effect regime is dominated by vortex velocity fluctuations while the density fluctuations, frequently considered in the conventional flux-flow noise models, are negligibly weak. Strong nongaussian fluctuations are associated with S-shaped current-voltage characteristics. The spectral properties of the noise reflect the form of the frequency characteristics of the dynamically coexisting vortex phases which is equivalent to the first order filter response. The cutoff frequency in the spectra corresponds to the time-of-flight of vortices through the disordered part of the sample.

Paper Details

Date Published: 9 May 2003
PDF: 14 pages
Proc. SPIE 5112, Noise as a Tool for Studying Materials, (9 May 2003); doi: 10.1117/12.488747
Show Author Affiliations
Grzegorz Jung, Ben Gurion Univ. of the Negev (Israel)
Weizmann Institute of Science (Israel)
Y. Paltiel, Weizmann Institute of Science (Israel)
E. Zeldov, Weizmann Institute of Science (Israel)
Y. Myasoedov, Weizmann Institute of Science (Israel)
M. L. Rappaport, Weizmann Institute of Science (Israel)
Miguel Ocio, CEA Saclay (France)
Shobo Bhattacharya, NEC Research Institute (United States)
M. J. Higgins, NEC Research Institute (United States)

Published in SPIE Proceedings Vol. 5112:
Noise as a Tool for Studying Materials
Michael B. Weissman; Nathan E. Israeloff; A. Shulim Kogan, Editor(s)

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