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Proceedings Paper

Impact of distortion removal techniques on band-to-band ratio measurement
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Paper Abstract

Infrared detectors operating in two or more wavebands can be used to obtain emissivity-area, temperature, and related parameters. While the cameras themselves may not collect data in the two bands simultaneously in space or time, the algorithms used to calculate such parameters rely on spatial and temporal alignment of the true optical data in the two bands. When such systems are tested in a hardware-in-the-loop (HWIL) environment, this requirement for alignment is in turn imposed on the projection systems used for testing. As has been discussed in previous presentations to this forum, optical distortion and misalignment can lead to significant band-to-band and band-to-truth simulation errors. This paper will address the potential impact of techniques to remove these errors on typical two-color estimation algorithms, as well as improvements obtained using distortion removal techniques applied to HWIL data collected at the Kinetic Kill Vehicle Hardware-in-the-Loop Simulator (KHILS) facility.

Paper Details

Date Published: 12 September 2003
PDF: 11 pages
Proc. SPIE 5092, Technologies for Synthetic Environments: Hardware-in-the-Loop Testing VIII, (12 September 2003); doi: 10.1117/12.488496
Show Author Affiliations
Wayne Keen, SYColeman (United States)
Brian C. Smith, SYColeman (United States)
David S. Flynn, Consultant for MacAulay-Brown, Inc. (United States)
Thomas P. Bergin, Mission Research Corp. (United States)
Nicholas I. Rummelt, Air Force Research Lab. (United States)
Rhoe A. Thompson, Air Force Research Lab. (United States)

Published in SPIE Proceedings Vol. 5092:
Technologies for Synthetic Environments: Hardware-in-the-Loop Testing VIII
Robert Lee Murrer Jr., Editor(s)

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