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Proceedings Paper

A sensitive method for detecting vibration in a scene projector test
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Paper Abstract

An unexpected effect was observed in a data set recently measured at the Kinetic Kill Vehicle Hardware-in-the-loop Simulator (KHILS) facility. A KHILS projector was driven to illuminate a contiguous block of emitters, with all other emitters turned off. This scene was measured with a two-color IR sensor. A sequence of 100 images was recorded, and certain statistics were computed from the image sequence. After measuring and analyzing these images, a “border” was observed with a particularly large standard deviation around the bright rectangular region. The pixels on the border of the region were much noisier than either inside or outside of the bright region. Although several explanations were possible, the most likely seemed to be a small vibration of either the sensor or projector. The sensor, for example, uses a mechanical cyro-cooler, which produces a vibration that can be felt by hand. Further analyses revealed an erratic motion of the position of objects in the image with amplitude of a few tents of the detector pitch. This small motion is sufficient to produce large fluctuations in the image pixel values in regions that have a large radiance gradient - such as suggest that the standard deviation of a “block image” sequence is easy to compute and will show the characteristic effect in the presence of image motion as small as a fraction of the detector pitch.

Paper Details

Date Published: 12 September 2003
PDF: 7 pages
Proc. SPIE 5092, Technologies for Synthetic Environments: Hardware-in-the-Loop Testing VIII, (12 September 2003); doi: 10.1117/12.488450
Show Author Affiliations
Breck A. Sieglinger, Consultant for MacAulay-Brown, Inc. (United States)
David S. Flynn, Consultant for MacAulay-Brown, Inc. (United States)
Richard Bryan Sisko, AEgis Technologies Group, Inc. (United States)
Rhoe A. Thompson, Air Force Research Lab. (United States)

Published in SPIE Proceedings Vol. 5092:
Technologies for Synthetic Environments: Hardware-in-the-Loop Testing VIII
Robert Lee Murrer Jr., Editor(s)

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