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Proceedings Paper

Continued development and integration of scene projection technologies in the AEDC space simulation chambers
Author(s): Heard S. Lowry III; Winfried H. Goethert; William T. Bertrand; Dustin H. Crider
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Paper Abstract

The process of integrating high-fidelity, complex dynamic scene projection systems into space simulation test chambers is a continual challenge which requires comprehensive analysis and measurement of the properties of the optical components involved. This includes the multiple-band source subsystems and the spectral tailoring methods invoked to represent target temperatures. Techniques currently employed in the AEDC space sensor test facilities will be discussed in this paper.

Paper Details

Date Published: 5 September 2003
PDF: 12 pages
Proc. SPIE 5075, Targets and Backgrounds IX: Characterization and Representation, (5 September 2003); doi: 10.1117/12.486958
Show Author Affiliations
Heard S. Lowry III, Sverdrup Technology, Inc. (United States)
Winfried H. Goethert, Sverdrup Technology, Inc. (United States)
William T. Bertrand, Sverdrup Technology, Inc. (United States)
Dustin H. Crider, Sverdrup Technology, Inc. (United States)

Published in SPIE Proceedings Vol. 5075:
Targets and Backgrounds IX: Characterization and Representation
Wendell R. Watkins; Dieter Clement; William R. Reynolds, Editor(s)

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