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Proceedings Paper

Role of gas environment in the process of deep-hole drilling by ultrashort laser pulses
Author(s): Sergei M. Klimentov; Taras V. Kononenko; P. A. Pivovarov; Serge V. Garnov; Vitali I. Konov; Detlef Breitling; Friedrich Dausinger
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Paper Abstract

The detailed study of the role of air pressure in deep hole drilling by femtosecond and picosecond intense laser pulses (Ti:Al2O3 and Nd:YAP lasers) was performed in the range 1÷1000 mBar. Steel sample plates were mostly tested, experimental data obtained for ceramic materials is also presented. The following ablation parameters were measured and analyzed: ablation rates and their dependence on the channel depth, ablated crater morphology, optical transmission in channels after through hole formation. Both percussion and helical drilling regimes were used. Special attention was paid to two strong gas assisted effects typical of sub-picosecond and sub-nanosecond material ablation, which are low threshold gas breakdown in deep channels and nonlinear interaction of ultra-short intense pulses with air resulting in conical emission. Unwanted aspects of both phenomena were shown to disappear in a moderate vacuum of ~100 mBar. A new approach to formation of such a vacuum in drilled channels was also proposed and experimentally modeled using ultra-high repetition rate nanosecond laser pulses.

Paper Details

Date Published: 19 February 2003
PDF: 6 pages
Proc. SPIE 4830, Third International Symposium on Laser Precision Microfabrication, (19 February 2003); doi: 10.1117/12.486540
Show Author Affiliations
Sergei M. Klimentov, General Physics Institute (Russia)
Taras V. Kononenko, General Physics Institute (Russia)
P. A. Pivovarov, General Physics Institute (Russia)
Serge V. Garnov, General Physics Institute (Russia)
Vitali I. Konov, General Physics Institute (Russia)
Detlef Breitling, Univ. of Stuttgart (Germany)
Friedrich Dausinger, Univ. of Stuttgart (Germany)

Published in SPIE Proceedings Vol. 4830:
Third International Symposium on Laser Precision Microfabrication
Isamu Miyamoto; Kojiro F. Kobayashi; Koji Sugioka; Reinhart Poprawe; Henry Helvajian, Editor(s)

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