Share Email Print

Proceedings Paper

Simulation benchmarking
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

Photolithography simulation has become a common methodology used in engineering tasks such as critical level patterning analysis and process design, patterning tool qualification to meet the process control requirements, selection of the patterning tools capable of delivering requisite patterning performance, and projection lens tuning for optimum patterning performance. Such diverse use of simulation is motivated by the need to quantify the patterning tradeoffs, when the performance margins collapse around the fundamental process constraints. These complex analysis and design tasks relay on various photolithography simulators available as commercial or proprietary software. The diversity of the available simulators poses two issues: what is the role of numerical methodologies in modifying the simulation analysis otherwise limited by the image formation fundamentals, and to what extend the results obtained with different simulators are similar to each other. In this paper, we present the results of the comparison involving three simulators, two of them commercial. The comparison involved image formation simulations of the current generation of the critical IC designs. The comparison was a basis of a judgment on the portability of simulation analyses obtained by various photolithography simulation tools.

Paper Details

Date Published: 26 June 2003
PDF: 12 pages
Proc. SPIE 5040, Optical Microlithography XVI, (26 June 2003); doi: 10.1117/12.485447
Show Author Affiliations
Jacek K. Tyminski, Nikon Precision Inc. (United States)
Toshiharu Nakashima, Nikon Corp. (Japan)
Takehito Kudo, Nikon Corp. (Japan)
Steve D. Slonaker, Nikon Precision Inc. (United States)
Shigeru Hirukawa, Nikon Corp. (Japan)

Published in SPIE Proceedings Vol. 5040:
Optical Microlithography XVI
Anthony Yen, Editor(s)

© SPIE. Terms of Use
Back to Top
Sign in to read the full article
Create a free SPIE account to get access to
premium articles and original research
Forgot your username?