Share Email Print

Proceedings Paper

Toward performance-driven reduction of the cost of RET-based lithography control
Author(s): Puneet Gupta; Andrew B. Kahng; Dennis Sylvester; Jie Yang
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

As minimum feature sizes continue to shrink, patterned features have become significantly smaller than the wavelength of light used in optical lithography. As a result, the requirement for dimensional variation control, especially in critical dimension (CD) 3σ, has become more stringent. To meet these requirements, resolution enhancement techniques (RET) such as optical proximity correction (OPC) and phase shift mask (PSM) technology are applied. These approaches result in a substantial increase in mask costs and make the cost of ownership (COO) a key parameter in the comparison of lithography technologies. No concept of function is injected into the mask flow; that is, current OPC techniques are oblivious to the design intent. The entire layout is corrected uniformly with the same effort. We propose a novel minimum cost of correction (MinCorr) methodology to determine the level of correction for each layout feature such that prescribed parametric yield is attained. We highlight potential solutions to the MinCorr problem and give a simple mapping to traditional performance optimization. We conclude with experimental results showing the RET costs that can be saved while attaining a desired level of parametric yield.

Paper Details

Date Published: 2 July 2003
PDF: 11 pages
Proc. SPIE 5043, Cost and Performance in Integrated Circuit Creation, (2 July 2003); doi: 10.1117/12.485277
Show Author Affiliations
Puneet Gupta, Univ. of California/San Diego (United States)
Andrew B. Kahng, Univ. of California/San Diego (United States)
Dennis Sylvester, Univ. of Michigan (United States)
Jie Yang, Univ. of Michigan (United States)

Published in SPIE Proceedings Vol. 5043:
Cost and Performance in Integrated Circuit Creation
Alfred K. K. Wong; Kevin M. Monahan, Editor(s)

© SPIE. Terms of Use
Back to Top