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Proceedings Paper

Identification of unusual events in multichannel bridge monitoring data using wavelet transform and outlier analysis
Author(s): Piotr Omenzetter; James M. W. Brownjohn; Pilate Moyo
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Paper Abstract

Continuously operating instrumented structural health monitoring (SHM) systems are becoming a practical alternative to replace visual inspection for assessment of condition and soundness of civil infrastructure. However, converting large amount of data from an SHM system into usable information is a great challenge to which special signal processing techniques must be applied. This study is devoted to identification of abrupt, anomalous and potentially onerous events in the time histories of static, hourly sampled strains recorded by a multi-sensor SHM system installed in a major bridge structure in Singapore and operating continuously for a long time. Such events may result, among other causes, from sudden settlement of foundation, ground movement, excessive traffic load or failure of post-tensioning cables. A method of outlier detection in multivariate data has been applied to the problem of finding and localizing sudden events in the strain data. For sharp discrimination of abrupt strain changes from slowly varying ones wavelet transform has been used. The proposed method has been successfully tested using known events recorded during construction of the bridge, and later effectively used for detection of anomalous post-construction events.

Paper Details

Date Published: 18 August 2003
PDF: 12 pages
Proc. SPIE 5057, Smart Structures and Materials 2003: Smart Systems and Nondestructive Evaluation for Civil Infrastructures, (18 August 2003); doi: 10.1117/12.484640
Show Author Affiliations
Piotr Omenzetter, Nanyang Technological Univ. (Singapore)
James M. W. Brownjohn, Nanyang Technological Univ. (Singapore)
Pilate Moyo, Nanyang Technological Univ. (Singapore)

Published in SPIE Proceedings Vol. 5057:
Smart Structures and Materials 2003: Smart Systems and Nondestructive Evaluation for Civil Infrastructures
Shih-Chi Liu, Editor(s)

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