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Proceedings Paper

Application of Photoelasticity for analysis of residual stresses in CDs
Author(s): Sergeiy I. Gerasimov; N. S. Bachurina; N. N. Emelyanova
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Paper Abstract

Residual stresses appeared with time due to the imperfection of the material production process. Sometimes the redistribution of residual stresses is the reason of cracks initiation in the tested object on one of the manufacturing stages or this redistribution increases them up to the critical value, when a small external load results in breakage ofthis object. Relaxation is the main reason of redistribution of residual stresses and it can occur without extemal influence or ifthere is heating, static and cyclic loads. Relaxation results in change of the sizes and shapes of the tested object. The dimensional stability is especially important in modern high technologies, in particular in the use of compact discs for the storage of information. Modem CDs are produced from polycarbonate, possessing an effect of birefringence. It allows to make an estimation of stresses at CDs by the method of photoelasticity. A metallized coating put on one of a CD surfaces provides ideal conditions for registration of interference picture observed in the reflected light. When investigating the stresses in CDs with the use of reflective V-type plane polariscope the solving equations become similar to those used in a photoelastic coating method. The present work discusses the results of the research of the residual stresses in CDs with various operation time produced by various firms and by different technologies (punching, laser recording). A simple optical method ofthe NDT ofCDs at various stages oftheir manufacturing is offered.

Paper Details

Date Published: 29 July 2002
PDF: 5 pages
Proc. SPIE 4900, Seventh International Symposium on Laser Metrology Applied to Science, Industry, and Everyday Life, (29 July 2002); doi: 10.1117/12.484619
Show Author Affiliations
Sergeiy I. Gerasimov, Siberian State Transport Univ. (Russia)
N. S. Bachurina, Siberian State Transport Univ. (Russia)
N. N. Emelyanova, Siberian State Transport Univ. (Russia)

Published in SPIE Proceedings Vol. 4900:
Seventh International Symposium on Laser Metrology Applied to Science, Industry, and Everyday Life
Yuri V. Chugui; Sergei N. Bagayev; Albert Weckenmann; P. Herbert Osanna, Editor(s)

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