Proceedings Paper
Origin of defects in nonlinear BBO crystals| Format | Member Price | Non-Member Price |
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Paper Abstract
Defects in nonlinear optical barium metaborate crystals (?- and ?-BBO) have been investigated by means of optical spectroscopy and thermal activation methods. Low-temperature absorption peaks have been observed in all samples. The dependence of these peaks upon crystalline phase and type of the flux used while growing is low. This fact indicates that intrinsic defects play the leading role in absorption.. It is shown that while growing BBO crystals by TSSG technique, defects, which form deep electron-type traps in the forbidden gap, are generated.
Paper Details
Date Published: 29 July 2002
PDF: 7 pages
Proc. SPIE 4900, Seventh International Symposium on Laser Metrology Applied to Science, Industry, and Everyday Life, (29 July 2002); doi: 10.1117/12.484618
Published in SPIE Proceedings Vol. 4900:
Seventh International Symposium on Laser Metrology Applied to Science, Industry, and Everyday Life
Yuri V. Chugui; Sergei N. Bagayev; Albert Weckenmann; P. Herbert Osanna, Editor(s)
PDF: 7 pages
Proc. SPIE 4900, Seventh International Symposium on Laser Metrology Applied to Science, Industry, and Everyday Life, (29 July 2002); doi: 10.1117/12.484618
Show Author Affiliations
Valery D. Antsygin, Institute of Automation and Electrometry (Russia)
Vladimir A. Gusev, Institute of Automation and Electrometry (Russia)
O. Yu. Dashevsky, Institute of Automation and Electrometry (Russia)
Vladimir A. Gusev, Institute of Automation and Electrometry (Russia)
O. Yu. Dashevsky, Institute of Automation and Electrometry (Russia)
V. P. Solntsev, Institute of Mineralogy and Petrography (Russia)
Eugene G. Tsvetkov, Institute of Mineralogy and Petrography (Russia)
Eugene G. Tsvetkov, Institute of Mineralogy and Petrography (Russia)
Published in SPIE Proceedings Vol. 4900:
Seventh International Symposium on Laser Metrology Applied to Science, Industry, and Everyday Life
Yuri V. Chugui; Sergei N. Bagayev; Albert Weckenmann; P. Herbert Osanna, Editor(s)
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