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Proceedings Paper

Photodetector interference field
Author(s): Nico P. Shestakov; A. A. Ivanenko; A. M. Sysoev
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Paper Abstract

Traditionally, special optical systems are used for observation of interference fields. Such a system is an interferometer, in which a beam oflight source is divided into two. The names oflight beams are object and reference. The way in which the light beams are integrated and transferred in the area of the image depends on the interferometer type. The Fizeau and Michelson interferometers are used often. In all these interferometers the course of reference and object light beams going in one direction is interrupted on photodetectors. The energy of light beams is absorbed by a photosensitive material of the photodetector, being transformed into a photoelectric signal. The photodetectors of different types: photodiodes, photoelectric multiplying tubes pyroelectric, solid-state detectector arrays are used for registration of interferogram. The known photodetectors considerably distort the course of light beams. Their large absorption distorts the form of the wavefront. This article provides a presentation of photodetector having a sensitivity to distribution of the interference field of light waves in space and time. The photodetector has a small distortion of the wavefront. It does not destruct the interference field. Thus, the process of measurement influences the interference field only slightly. The photodetector can be used for registration of distribution of an interference field in space and time. The use of photodetector is for measurement of light streams extending in opposite directions. The application of the photodetector allows simplifying the optical schemes. Beam splitters and reference mirrors are not necessary. Some example applications photodetector are presented. A simple interferometer for a measuring transitions and holographic images is described.

Paper Details

Date Published: 29 July 2002
PDF: 9 pages
Proc. SPIE 4900, Seventh International Symposium on Laser Metrology Applied to Science, Industry, and Everyday Life, (29 July 2002); doi: 10.1117/12.484537
Show Author Affiliations
Nico P. Shestakov, Kirensky Institute of Physics (Russia)
A. A. Ivanenko, Kirensky Institute of Physics (Russia)
A. M. Sysoev, Kirensky Institute of Physics (Russia)

Published in SPIE Proceedings Vol. 4900:
Seventh International Symposium on Laser Metrology Applied to Science, Industry, and Everyday Life
Yuri V. Chugui; Sergei N. Bagayev; Albert Weckenmann; P. Herbert Osanna, Editor(s)

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