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Proceedings Paper

In situ optical absorption spectroscopy, incandencence, and light scattering characterization of single-wall carbon nanotube synthesis by the laser vaporization technique
Author(s): Alexander A. Puretzky; David B. Geohegan; C. Henrik Schittenhelm
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Paper Abstract

In this paper we discuss three optical methods for in situ characterization of single wall carbon nanotube (SWNT) growth by laser vaporization at elevated temperatures: optical absorption spectroscopy, optical incandescence, and light scattering. Optical absorption spectroscopy was successfully used to estimate the size of carbon nanoparticles and to monitor the atomic metal catalyst in the propagating laser ablation plume. These measurements indicate that the aggregation rate of carbon nanoparticles increases rapidly at lower oven processing temperatures. The second method, incandescence, was applied to measure the particle temperature within the propagating plume at different times after ablation. The third approach, imaging of the plume using Rayleigh scattered light, was used to monitor the ejected material inside the hot furnace as well as to observe the plume when it exits the furnace, i.e., in the cold zone of a quartz tube reactor. We demonstrated that Rayleigh scattering imaging combined with TEM analysis of the produced material was very useful for controlling the length of SWNTs and estimation of the growth rates. A general picture of SWNT growth by laser vaporization based on in situ diagnostics of ejected material at different times after ablation is discussed.

Paper Details

Date Published: 17 October 2003
PDF: 10 pages
Proc. SPIE 4977, Photon Processing in Microelectronics and Photonics II, (17 October 2003);
Show Author Affiliations
Alexander A. Puretzky, Univ. of Tennessee (United States)
David B. Geohegan, Oak Ridge National Lab. (United States)
C. Henrik Schittenhelm, Robert Bosch GmbH (Germany)

Published in SPIE Proceedings Vol. 4977:
Photon Processing in Microelectronics and Photonics II
Alberto Piqué; David B. Geohegan; Friedrich G. Bachmann; Koji Sugioka; Frank Träger; Jan J. Dubowski; Peter R. Herman; Willem Hoving; Kouichi Murakami; Kunihiko Washio; Jim Fieret, Editor(s)

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